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专利名称：YEAST WITH INCREASED BUTANOL
TOLERANCE INVOLVING CELL WALLINTEGRITY PATHWAY
发明人：MICHAEL G. BRAMUCCI,ROBERT A.
LAROSSA,DANA R. SMULSKI
申请号：US123030申请日：20091221
公开号：US201001673A1公开日：20100701
专利附图：
摘要：Increasing tolerance to butanol in yeast has been accomplished by increasing
activity of the cell wall integrity pathway. Yeast with increased expression of SLT2p, amitogen activated protein kinase of the MAPK module of the cell wall integrity pathwayhad increased tolerance to isobutanol. These yeast may be used for improved butanolproduction.
申请人：MICHAEL G. BRAMUCCI,ROBERT A. LAROSSA,DANA R. SMULSKI
地址：BOOTHWYN PA US,CHADDS FORD PA US,WILMINGTON DE US
国籍：US,US,US
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